Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.

Manufacturer of non-contact 3D profilometers based on interferometry and optical inspection systems. Includes overview of technologies, applications, product specifications, software, resources and contacts in Quebec.

Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.

Surface analysis instrumentation, including X-ray photoelectron spectroscopy, AES, ESCA, TOF-SIMS and D-SIMS. Overview of techniques, applications, product specifications, contract services, support and global contacts.